ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device Model (CDM) – Device Level

Published by	Publication Date	Number of Pages
ESD	07/26/2022	52

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Category: ESD

Description

ESD JS-002 – ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device Model (CDM) – Device Level

This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.