1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
Product Details
Published:
05/01/2013
Number of Pages:
2
File Size:
1 file , 50 KB
Note:
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