ASTM F1190 – Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation to determine the permanent damage in the components. Validated 1-MeV displacement damage functions codified in National Standards are not currently available for other semiconductor materials.
Product Details
Published:
03/01/2018
Number of Pages:
6
File Size:
1 file , 100 KB
Redline File Size:
2 files , 190 KB
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