ASTM E1634 – Standard Guide for Performing Sputter Crater Depth Measurements
1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment, and computerized system.
Product Details
Published:
11/01/2019
Number of Pages:
3
File Size:
1 file , 160 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
