ASTM E3220 – Standard Guide for Characterization of Graphene Flakes
1.1 This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement.
Product Details
Published:
04/01/2020
Number of Pages:
13
File Size:
1 file , 500 KB
Note:
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