CIE x040

CIE x040

$46.00

Proceedings of CIE Expert Symposium on Measurement Uncertainties in Photometry and Radiometry for Industry

Published by Publication Date Number of Pages
CIE 10/01/2014 80
Preview
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

CIE x040 – Proceedings of CIE Expert Symposium on Measurement Uncertainties in Photometry and Radiometry for Industry

This Symposium was organized by CIE Division 2 in cooperation with the CIE Central Bureau, and was hosted by the CIE Central Bureau in Vienna, Austria. The Symposium featured contributed papers of leading experts in photometry and radiometry presenting facts and recent research in measurement uncertainties in photometry and radiometry, especially regarding application in industry.

Product Details

Published:
10/01/2014
ISBN(s):
9783902842220
Number of Pages:
80
File Size:
1 file , 6.4 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus

In Demand Now