ESD TR5.4-01
$20.00
Transient Induced Latch-Up (TLU)
Published by | Publication Date | Number of Pages |
ESD | 2000 | 29 |
Description
ESD TR5.4-01 – Transient Induced Latch-Up (TLU)
This report provides a brief background on early latch-up work, reviews the issues surrounding the power supply response requirements, and discusses the efforts on RLC TLU testing, transmission line pulse (TLP) stressing, and the new bi-polar stress TLU methodology.
Product Details
- Published:
- 2000
- Number of Pages:
- 29
- File Size:
- 1 file , 730 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus