JEDEC EIA 318-B

Description

JEDEC EIA 318-B – MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.

Product Details

Published:

07/01/1996

Number of Pages:

18

File Size:

1 file , 480 KB

Note:

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