JEDEC JEP119A

Description

JEDEC JEP119A – A PROCEDURE FOR EXECUTING SWEAT

This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M – 96.

Product Details

Published:

08/01/2003

Number of Pages:

32

File Size:

1 file , 270 KB

Note:

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