JEDEC JESD 22-A108C

JEDEC JESD 22-A108C

$32.00

TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 06/01/2005

PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.

Product Details

Published:
06/01/2005
Number of Pages:
13
File Size:
1 file , 79 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

In Demand Now