JEDEC JESD 435 (R2009)

JEDEC JESD 435 (R2009)

$37.00

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

Published by Publication Date Number of Pages
JEDEC 04/01/1976 23
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Description

JEDEC JESD 435 (R2009) – STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

Product Details

Published:
04/01/1976
Number of Pages:
23
File Size:
1 file , 620 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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