JEDEC JESD22-A100E

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Cycled Temperature Humidity-Bias with Surface Condensation Life Test

Published by Publication Date Number of Pages
JEDEC 11/01/2020 10
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JEDEC JESD22-A100E – Cycled Temperature Humidity-Bias with Surface Condensation Life Test

The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of temperature cycling, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors that pass through it. The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.

Product Details

Published:
11/01/2020
Number of Pages:
10
File Size:
1 file , 170 KB
Redline File Size:
2 files , 3.1 MB
Note:
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