JEDEC JESD22-A103C

Description

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and temperature, understorage conditions, for thermally activated failure mechanisms of solid state electronic devices, includingnonvolatile memory devices (data retention failure mechanisms). During the test elevated temperatures(accelerated test conditions) are used without electrical stress applied. This test may be destructive,depending on Time, Temperature and Packaging (if any).

Product Details

Published:

11/01/2004

Number of Pages:

9

File Size:

1 file , 77 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus