JEDEC JESD22-B108B

Description

JEDEC JESD22-B108B – COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices. This test method is applicable for inspection and device characterization. If package warpage or coplanarity is to be characterized at reflow soldering temperatures, then JESD22-B112 should be used.

Product Details

Published:

09/01/2010

Number of Pages:

14

File Size:

1 file , 54 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus