JEDEC JESD51-1

JEDEC JESD51-1

$47.00

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

Published by Publication Date Number of Pages
JEDEC 12/01/1995 36
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Description

JEDEC JESD51-1 – INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.

Product Details

Published:
12/01/1995
Number of Pages:
36
File Size:
1 file , 560 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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