JEDEC JESD6 (R2002)

Description

JEDEC JESD6 (R2002) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

Product Details

Published:

02/01/1967

Number of Pages:

17

File Size:

1 file , 280 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus