JEDEC JESD89-2A

JEDEC JESD89-2A

$36.00

TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE

Published by Publication Date Number of Pages
JEDEC 10/01/2007 19
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

JEDEC JESD89-2A – TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE

This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source.

Product Details

Published:
10/01/2007
Number of Pages:
19
File Size:
1 file , 150 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

In Demand Now