JEDEC JESD91-A (R2011)

Description

The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.

Product Details

Published:

08/01/2003

Number of Pages:

20

File Size:

1 file , 110 KB

Note:

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