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JIS R 1636
Original price was: $40.00.$20.00Current price is: $20.00.
Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
JIS R 1636 – Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer
Product Details
- Published:
- 01/01/1998
- File Size:
- 1 file , 420 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus